| DOI | Resolve DOI: https://doi.org/10.1109/3.622632 |
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| Author | Search for: Ryzhii, Victor; Search for: Liu, H. C.1; Search for: Khmyrova, Irina; Search for: Ryzhii, Maxim |
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| Affiliation | - National Research Council Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Subject | analytical device model; contrast transfer characteristic; contrast transfer ratio; e output current density; electron capture; electron capture parameter; image resolution; image sensors; incident image; infrared detectors; integrated quantum-well infrared photodetector; light-emitting diode; long-wavelength infrared images; multiple-quantum-well structure; nonuniform current; nonuniform distribution; photodetectors; pixelless imaging devices; semiconductor quantum wells; short-wavelength infrared images; transport processes |
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| Abstract | The conversion of images into nonuniform distribution of the output current density in a multiple-quantum-well structure for an infrared pixelless imaging system is considered using an analytical device model. The nonuniform current, which reproduces the incident image, is converted back to a light-emitting diode emission image by the device considered here. The developed model takes into account transport processes responsible for the device operation. An explicit expression for the contrast transfer characteristic is derived as a function of the number of quantum wells (QWs) and the electron capture parameter. It is shown that the quality of the up-converted images (contrast and resolution) is improved with increasing number of QWs. The pixelless imaging devices under consideration can effectively convert long-wavelength infrared images into short-wavelength infrared or visible images with contrast transfer ratio close to unity |
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| Publication date | 1997-09 |
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| In | |
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| NPARC number | 12328898 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a30f85b1-e089-4f6b-b0ce-eed16f6d39fb |
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| Record created | 2009-09-10 |
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| Record modified | 2020-03-20 |
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