| Download | - View accepted manuscript: TEM characterization of phase separation and transformation at the thin film intefaces in the SrFeO2.5+x/SiO2/Si system (PDF, 861 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1017/S1431927605504215 |
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| Author | Search for: Wang, Dashan; Search for: Du, Xiaomei1; Search for: Tunney, Jim1; Search for: Post, Michael1; Search for: Gauvin, Raynald |
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| Affiliation | - National Research Council Canada. NRC Institute for Chemical Process and Environmental Technology
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| Format | Text, Article |
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| Subject | Transmission electron microscopy (TEM); thin film; pulsed laser deposition (PLD); amorphous film |
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| Publication date | 2005 |
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| Access condition | |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRCC 51834 |
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| NPARC number | 11786482 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a31fbb95-60c6-44c3-adfd-f7ebd4dce978 |
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| Record created | 2009-10-02 |
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| Record modified | 2020-04-07 |
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