| DOI | Resolve DOI: https://doi.org/10.1088/1367-2630/15/7/073038 |
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| Author | Search for: Mutus, J.Y.1; Search for: Livadaru, L.1; Search for: Urban, R.1; Search for: Pitters, J.1; Search for: Peter Legg, A.1; Search for: Salomons, M.H.1; Search for: Cloutier, M.1; Search for: Wolkow, R.A.1 |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Subject | coherence properties; emission current; extraction voltage; high-aspect ratio; holographic measurement; low energy electrons; point source microscopes; virtual sources; aspect ratio; electrons; optical microscopy; tungsten |
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| Abstract | This report demonstrates the most spatially-coherent electron source ever reported. A coherence angle of 14.3 ± 0.5° was measured, indicating a virtual source size of 1.7 ± 0.6 Å using an extraction voltage of 89.5 V. The nanotips under study were crafted using a spatially-confined, field-assisted nitrogen etch which removes material from the periphery of the tip apex resulting in a sharp, tungsten-nitride stabilized, high-aspect ratio source. The coherence properties are deduced from holographic measurements in a low-energy electron point source microscope with a carbon nanotube bundle as sample. Using the virtual source size and emission current the brightness normalized to 100 kV is found to be 7.9 × 108 A sr-1 cm2. © IOP Publishing and Deutsche Physikalische Gesellschaft. |
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| Publication date | 2013 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21269991 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a351e2f9-8e8e-49d5-bc52-a71e353dead0 |
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| Record created | 2013-12-13 |
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| Record modified | 2020-04-22 |
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