Measuring strain fields surrounding grain-boundary dislocations in silicon using scanning transmission electron microscopy

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  1. National Research Council of Canada. Energy, Mining and Environment
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ConferenceMicroscopy and Microanalysis 2014, M and M 2014, 3 August 2014 through 7 August 2014
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Peer reviewedYes
NPARC number21275528
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Record identifiera51f9b4d-8d4e-4c55-b45e-63033d87121d
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