National Research Council of Canada. NRC Institute for Microstructural Sciences
11th International Conference on Group IV Photonics, GFP 2014, 27 August 2014 through 29 August 2014
The coupling efficiency of a surface grating coupler is optimized for a an arbitrary buried oxide thickness by adjusting the grating radiation angle. The coupler is apodized using a subwavelength structure, allowing a single etch step fabrication. The measured coupling loss is -2.16dB with 3dB bandwidth of 64nm, for a minimum feature size of 100nm. It is also shown by simulations that by implementing this coupler in a double SOI (DSOI) wafer, an ultra-low coupling loss of -0.42dB is achieved.
IEEE International Conference on Group IV Photonics GFP, 6962018 (27 August 2014): 41–42.