Modeling the effect of a buried layer in GaAs metal-semiconductor-metal photodetectors

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.359491
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
SubjectBURIED LAYERS; FINITE DIFFERENCE METHOD; GALLIUM ARSENIDES; MOS JUNCTIONS; PHOTODETECTORS; SIMULATION; SPACE CHARGE; TRANSIENTS
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LanguageEnglish
Peer reviewedYes
NPARC number12339008
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Record identifiera82e615f-608f-43d7-b4a3-5cfa8bf0516b
Record created2009-09-11
Record modified2020-04-29
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