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Femtosecond laser desorption of thin polymer films from a dielectric surface

From National Research Council Canada

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Affiliation
  1. National Research Council of Canada. Security and Disruptive Technologies
FormatText, Article
ConferenceCLEO: Science and Innovations, CLEO_SI 2013, 9 June 2013 through 14 June 2013, San Jose, CA
SubjectBeam geometry; Dielectric surface; Thin polymer films; Two ways; Atomic force microscopy; Semiconducting films; Ultrashort pulses; Polymer films
Abstract
We desorb polymer films from fused silica with a femtosecond laser and characterize the results by atomic force microscopy. Our study as a function of beam geometry and energy reveals two ways of achieving spatially controlled nanodesorption. © OSA 2013.
Publication date
In
  • CLEO: Science and Innovations, CLEO_SI 2013 (2013).
LanguageEnglish
Peer reviewedYes
NPARC number21270698
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Record identifiera9adb067-0b83-40e3-ae31-574cd3824b32
Record created2014-02-17
Record modified2020-04-22
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