Language selection

Government of Canada / Gouvernement du Canada

Search

Accuracy and applications of electron-beam deposited nano-dot fiducial markers in electron tomography of rod-shaped specimens

From National Research Council Canada

AuthorSearch for: ; Search for: ; Search for: 1; Search for: 1
Affiliation
  1. National Research Council Canada
FormatText, Poster
ConferenceMicroscopy for Global Challenges, Touching Atoms, Molecules, Nanostructures and Cells by Multidimensional Microscopy (18th International Microscopy Congress), Sept. 7-12, 2014, Prague, Czech Republic
Physical description2 p.
Publication date
PublisherCzechoslovak Microscopy Society
In
  • 18th International Microscopy Congress.
LanguageEnglish
Peer reviewedYes
IdentifierIT-10-P-1482
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifieraa340a7d-b546-40c5-b1f0-7bb92c5b75e2
Record created2020-02-28
Record modified2020-03-02
Date modified: