| DOI | Resolve DOI: https://doi.org/10.1063/1.4872383 |
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| Author | Search for: Salomons, M.1; Search for: Martins, B.V.C.1; Search for: Zikovsky, J.1; Search for: Wolkow, R.A.1 |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Subject | Loading; Microscopes; Scanning electron microscopy; Surfaces; Atomic resolution; Automated feedback; Contact formation; Electrical stability; Field ion microscope; Four-probe measurement; Material characterizations; Reproducibilities; Probes |
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| Abstract | We present an ultrahigh vacuum (UHV) three-probe scanning tunneling microscope in which each probe is capable of atomic resolution. A UHV JEOL scanning electron microscope aids in the placement of the probes on the sample. The machine also has a field ion microscope to clean, atomically image, and shape the probe tips. The machine uses bare conductive samples and tips with a homebuilt set of pliers for heating and loading. Automated feedback controlled tip-surface contacts allow for electrical stability and reproducibility while also greatly reducing tip and surface damage due to contact formation. The ability to register inter-tip position by imaging of a single surface feature by multiple tips is demonstrated. Four-probe material characterization is achieved by deploying two tips as fixed current probes and the third tip as a movable voltage probe. © 2014 AIP Publishing LLC. |
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| Publication date | 2014 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21272249 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | aa3f04a5-1cb4-4436-b6d5-72d065d3051b |
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| Record created | 2014-07-23 |
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| Record modified | 2020-04-22 |
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