| DOI | Resolve DOI: https://doi.org/10.1117/12.459674 |
|---|
| Author | Search for: Smith, Henry; Search for: Hills, Richard E.; Search for: Withington, Stafford; Search for: Richer, Johnathan; Search for: Leech, Jamie; Search for: Williamson, Ross; Search for: Gibson, Hugh; Search for: Dace, Roger; Search for: Ananthasubramanian, P.G.; Search for: Barker, Robert W.+; Search for: Baldwin, Robert; Search for: Stevenson, Howard; Search for: Doherty, Peter; Search for: Molloy, Dennis; Search for: Quy, Victor; Search for: Lush, Chris; Search for: Hales, Sally; Search for: Dent, William R.F.; Search for: Pain, Ian; Search for: Wall, Robert; Search for: Hastings, Peter R.; Search for: Graham, Brenda; Search for: Baillie, Thomas E.C.; Search for: Laidlaw, Ken; Search for: Bennett, Richard J.; Search for: Laidlaw, Ian; Search for: Duncan, William; Search for: Ellis, Maureen A.; Search for: Redman, Russell O.1; Search for: Wooff, Robert1; Search for: Yeung, Keith K.1; Search for: Fitzsimmons, Joelef T.1; Search for: Avery, Lorne1; Search for: Derdall, Dennis1; Search for: Josephson, Dean1; Search for: Anthony, André1; Search for: Atwal, Raj1; Search for: Chylek, Tomas; Search for: Shutt, Dean J.; Search for: Friberg, Per; Search for: Rees, Nicholas P.; Search for: Philips, Robin; Search for: Kroug, Matthias; Search for: Klapwijk, Teun M.; Search for: Zijlstra, Tony |
|---|
| Affiliation | - National Research Council Canada. NRC Herzberg Institute of Astrophysics
|
|---|
| Format | Text, Article |
|---|
| Conference | Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States |
|---|
| Publication date | 2003 |
|---|
| Publisher | SPIE |
|---|
| In | |
|---|
| Series | |
|---|
| Language | English |
|---|
| Peer reviewed | Yes |
|---|
| NPARC number | 9724069 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | b0005581-533f-4743-aceb-2a5d6ce19544 |
|---|
| Record created | 2009-07-17 |
|---|
| Record modified | 2020-04-02 |
|---|