Growth of undulating Si0.5Ge0.5 layers for photodetectors at λ=1.55 µm

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.370883
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Affiliation
  1. National Research Council of Canada. NRC Institute for National Measurement Standards
  2. National Research Council of Canada. NRC Institute for Microstructural Sciences
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LanguageEnglish
NRC numberNRC-INMS-1082
NPARC number8896605
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Record identifierb24c858d-0c10-4165-b14b-2b1da47167ea
Record created2009-04-22
Record modified2020-03-20
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