Growth of undulating Si0.5Ge0.5 layers for photodetectors at λ=1.55 µm

DOIResolve DOI: https://doi.org/10.1063/1.370883
AuthorSearch for: ; Search for: 1; Search for: 2; Search for: 2
Affiliation
  1. National Research Council Canada. NRC Institute for National Measurement Standards
  2. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Publication date
In
LanguageEnglish
NRC numberNRC-INMS-1082
NPARC number8896605
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifierb24c858d-0c10-4165-b14b-2b1da47167ea
Record created2009-04-22
Record modified2020-03-20

Page details

From:

Date modified: