| DOI | Resolve DOI: https://doi.org/10.1109/JQE.2009.2013216 |
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| Author | Search for: Merchant, C. A.; Search for: Scrutton, P.; Search for: Garcia-Blanco, S.; Search for: Hnatovsky, C.; Search for: Taylor, R. S.1; Search for: Garcia-Navarro, A.; Search for: Garcia, G.; Search for: Agullo-Lopez, F.; Search for: Olivares, J.; Search for: Helmy, A. S.; Search for: Aitchison, J. S. |
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| Affiliation | - National Research Council of Canada. Measurement Science and Standards
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| Format | Text, Article |
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| Subject | laser crystals; microreflectivity; optical planar waveguides; Raman spectrosc |
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| Abstract | We report on the characterization of planar waveguides formed in the Raman-active crystal KGd(WO 4 ) 2 using swift carbon, fluorine, and oxygen ion irradiation. The characterization of the waveguiding regions was performed using high-resolution microreflectivity and micro-Raman spectroscopy. The high-resolution microreflectivity measurement fully characterizes the refractive index profile of the barrier formed by amorphization of the crystal and detects other index variations not detected by the m-line technique. Raman spectroscopy measurements reveal details of the Raman properties of the crystal in the waveguiding region in relation to the rest of the sample for the different ion irradiations. Both of these measurement techniques are shown to be important for use of KGd(WO 4 ) 2 in integrated Raman-active devices. |
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| Publication date | 2009-03-21 |
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| Publisher | IEEE |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23004970 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b4371731-555c-4bcf-95de-54fa89837e9a |
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| Record created | 2019-01-24 |
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| Record modified | 2020-04-16 |
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