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Effect of voltage level on the performance of silicone rubber in the inclined plane tracking and erosion test

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/CEIDP55452.2022.9985319
AuthorSearch for: 1; Search for: 2; Search for: 1; Search for: 3; Search for: 3; Search for: 4
Affiliation
  1. University of Waterloo. Computer Engineering Department
  2. National Research Council of Canada. Metrology Research Centre
  3. Qatar University.Center for Advanced Materials
  4. Texas A&M University at Qatar. Chemical Engineering Program
FunderSearch for: Qatar National Research Fund
FormatText, Article
Conference2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), October 30 - November 2, 2022, Denver, Colorado, United States
Subjectdegradation; silicon compounds; resistance; insulation; systematics; voltage; high-voltage techniques; alumina; arcs (electric); erosion; filled polymers; insulation testing; insulator testing; polymer insulators; silicon compounds; silicone rubber
Abstract
This paper investigates the effect of the test voltage level on the performance of silicone rubber in inclined plane tracking and erosion test. Silicone rubber composites, filled with either alumina tri-hydrate or ground silica to 30 wt% or 50 wt%, are tested in inclined plane tracking and erosion test under 2.5 kV, 3.5 kV, and 4.5 kV. The degradation patterns of the tested silicone rubber surfaces are found dependent on the test voltage level during the inclined plane tracking and erosion test, as the dry-band arcing on silicone rubber tends to form tracks under relatively mild test voltages and deep erosion under the critical test voltage. These findings confirm the importance of employing the critical voltage while evaluating the erosion resistance of silicone rubber in the inclined plane tracking and erosion test. In addition, the critical test voltage of silicone rubber is found dependent on the amount of filler added to the composite.
Publication date
PublisherIEEE
In
  • 2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), 9985319 (30 October 2022): 515–518.
LanguageEnglish
Peer reviewedYes
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Record identifierb46a4a78-c768-42ca-a695-107557d5ac7b
Record created2023-06-30
Record modified2023-06-30
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