Characterization of Gd2O3 Films Deposited on Si(100) by Electron-Beam Evaporation

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1149/1.1337607
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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for National Measurement Standards
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NPARC number12744903
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Record identifierb5c72d27-a729-4794-b57a-14f4ddcd49a0
Record created2009-10-27
Record modified2020-03-27
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