| DOI | Resolve DOI: https://doi.org/10.1109/ICSENS.2011.6127315 |
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| Author | Search for: Griffin, R.H.; Search for: Kochermin, A.; Search for: Tarr, N.G.; Search for: McIntosh, H.1; Search for: Ding, H.1; Search for: Weber, J.1; Search for: Falcomer, R. |
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| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Conference | 10th IEEE SENSORS Conference 2011, SENSORS 2011, 28 October 2011 through 31 October 2011, Limerick |
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| Subject | Count rates; Radon concentrations; Radon detectors; Radon monitors; Readout Electronics; Second generation; Turn-on transients; Electrostatics; Sensors; Radon |
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| Abstract | A second generation fast-responding passive radon detector using electrostatic concentration and enhanced readout electronics has been designed, built and tested. This detector utilizes the custom α-detecting IC called αRAM. In order to assess the response time, simulations were performed to analyze the turn-on transient of the detector. In an ambient with constant radon concentration, simulations indicate 1.44 hours will be required for the detector to reach 90% of its maximum count rate. This result is consistent with experimental findings using both first and second generation passive radon detectors. © 2011 IEEE. |
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| Publication date | 2011 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21271507 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b60c4aad-6ac6-4ba1-996d-59ccffd4a39b |
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| Record created | 2014-03-24 |
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| Record modified | 2020-04-21 |
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