Hitachi HF-3300 TEM / STEM at NRC-NANO: an advanced electron microscopy platform for practical application development in nanotechnology
Hitachi HF-3300 TEM / STEM at NRC-NANO: an advanced electron microscopy platform for practical application development in nanotechnology
| Author | Search for: 1; Search for: 1 |
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| Format | Text, Address |
| Conference | Meeting of the Korean Society of Microscopy, June 20 – 22, 2018, Jeju, Korea |
| Publication date | 2018-06 |
| Publisher | Korean Society of Microscopy |
| Language | English |
| Export citation | Export as RIS |
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| Record identifier | b6523eb2-3025-4beb-925c-04e40b06a60d |
| Record created | 2021-08-27 |
| Record modified | 2021-08-27 |
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