| DOI | Resolve DOI: https://doi.org/10.1016/j.cam.2005.04.041 |
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| Author | Search for: Steele, A.; Search for: Douglas, R. J. |
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| Format | Text, Article |
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| Conference | CMMSE-2004, International Conference on Computational and Mathematical Methods in Science and Engineering, June 4-8, 2004, Uppsala, Sweden |
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| Abstract | We examine different x² statistics appropriate for high-level metrology. “Key” measurement comparisons often need statistics that can be used before a reference value is chosen. One such statistic is the pair-difference x², presented here. This is also a natural way to examine bilateral equivalences essential for trade. Monte Carlo simulation is a practical means to extend rigor beyond conventional x² testing, and permits the use of a wide variety of reference values for familiar null-hypothesis testing. Further, simulation enables the handling of measurements purportedly drawn from Student distributions or with reported inter-laboratory covariances. |
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| Publication date | 2006-07-15 |
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| Publisher | Elsevier |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRC-INMS-2344 |
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| NPARC number | 8896590 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b8361adc-a102-484f-ab27-36e9ec434456 |
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| Record created | 2009-04-22 |
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| Record modified | 2024-02-13 |
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