RF passive devices on Si with excellent performance, close to ideal devices designed by electro-magnetic simulation

From National Research Council Canada

Alternative titleIEEE Int’l Electron Device Meeting Technical Digest
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Name affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText
TypeArticle
ConferenceIEEE Int’l Electron Device Meeting, 2003
Volume375
Terms of use
NPARC number3539221
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Record identifierbb431d21-f8a3-44c2-9656-11baec684532
Record created2009-03-01
Record modified2019-02-14
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