| Download | - View final version: Subsurface flaw detection in reflective materials by thermal-transfer imaging (PDF, 607 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1117/12.55760 |
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| Author | Search for: Maldague, Xavier P.; Search for: Krapez, Jean-Claude1; Search for: Cielo, Paolo G.1 |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Subject | infrared thermography; surface emissivity; transfer imaging; flaw detection; nondestructive inspection |
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| Abstract | A thermal imaging apparatus is described for the nondestructive detection of subsurface defects in materials that would not usually lend themselves to thermal imaging because of their low emissivity and high susceptibility to background reflection noise. This is accomplished by transferring the thermal image produced by surface temperature perturbation of the workpiece material to a high emissivity material with which it is continuously brought in contact. The transferred thermal image may be observed by a suitable infrared device, resulting in a high radiance image with minimum reflectivity or variable emissivity noise. Numerical simulations, as well as experimental results, are presented |
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| Publication date | 1991-01-01 |
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| Publisher | SPIE |
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| Licence | - Copyright 1991 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23004551 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | c0df629e-ff1b-4fbc-966a-9fef1390dd73 |
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| Record created | 2018-11-19 |
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| Record modified | 2023-12-05 |
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