| Download | - View final version: Characterizing ultrashort pulses with photon energies above 1.12 eV based on transient absorption in silicon thin films (PDF, 1.7 MiB)
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| DOI | Resolve DOI: https://doi.org/10.1088/2515-7647/ad9cdb |
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| Author | Search for: Kumar, MayankORCID identifier: https://orcid.org/0000-0002-9237-1567; Search for: Mokhtari, Saadat1; Search for: Guay, Tristan; Search for: Leblanc, AdrienORCID identifier: https://orcid.org/0000-0002-5894-6611; Search for: Oubrerie, KostaORCID identifier: https://orcid.org/0000-0002-6676-6856; Search for: A. Jalil, Sohail1ORCID identifier: https://orcid.org/0000-0002-3149-6374; Search for: Haddad, Elissa; Search for: Jargot, Gaëtan; Search for: Lassonde, Philippe; Search for: Ibrahim, HeideORCID identifier: https://orcid.org/0000-0001-6371-8501; Search for: Vampa, Giulio1ORCID identifier: https://orcid.org/0000-0001-8492-3408; Search for: Légaré, FrançoisORCID identifier: https://orcid.org/0000-0002-3065-7156 |
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| Affiliation | - National Research Council Canada. Quantum and Nanotechnologies
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| Funder | Search for: Fonds de recherche du Québec. Nature et technologies; Search for: National Research Council of Canada. Quantum Sensors Program; Search for: Natural Sciences and Engineering Research Council of Canada; Search for: Canada Foundation for Innovation; Search for: PROMPT |
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| Format | Text, Article |
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| Subject | pulse characterization; silicon; frequency-resolved optical switching; transient absorption |
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| Abstract | Frequency-resolved optical switching (FROSt) is a phase-matching-free characterization technique for ultrashort pulses based on transient absorption in semiconductors. So far, this technique has been limited to characterizing pulses with photon energies smaller than the bandgap of the semiconductors used. In this work, we extend the method to characterize pulses of photon energy greater than the bandgap of the semiconductor used for characterization. We demonstrate this by characterizing ultrashort visible pulses and supercontinuum using silicon (Si) thin films deposited on a sapphire substrate. We also demonstrate that visible light sources up to a repetition rate of 250 kHz can be characterized using these samples. Therefore, this study highlights the potential of FROSt as a suitable technique for the temporal characterization of weak visible to infrared pulses, including high harmonics generated in solids. |
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| Publication date | 2024-12-19 |
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| Publisher | IOP |
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| Licence | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | c5e9063a-752e-402b-b71f-37aaf5d48479 |
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| Record created | 2025-06-05 |
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| Record modified | 2025-11-03 |
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