Axial resistivity measurement of a nanopillar ensemble using a cross-bridge Kelvin architecture

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1116/1.4794182
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Affiliation
  1. National Research Council of Canada. Security and Disruptive Technologies
FormatText, Article
SubjectCross-bridge kelvin resistors; Direct measurement; Electronic performance; Four-point probe techniques; Glancing Angle Deposition; Indium tin oxide; Longitudinal axis; Resistivity measurement; Deposits; Electric properties; Thin films; Tin oxides; Vapor deposition; Nanostructures
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LanguageEnglish
Peer reviewedYes
NPARC number21271818
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Record identifierc864413d-2341-4e52-9245-11ee9d4fd91b
Record created2014-04-22
Record modified2020-04-22
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