| DOI | Resolve DOI: https://doi.org/10.1103/PhysRevB.70.214406 |
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| Author | Search for: Fritzsche, H.1; Search for: Liu, Y. T.; Search for: Hauschild, J.; Search for: Maletta, H. |
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| Affiliation | - National Research Council of Canada. NRC Steacie Institute for Molecular Sciences
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| Format | Text, Article |
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| Abstract | We used polarized neutron reflectometry (PNR) to determine the absolute magnetic moment of uncovered and V-covered Fe films in the thickness range from 0.3 to 5.5 nm . The films were prepared by molecular beam epitaxy on a V(100) buffer layer grown on a MgO(100) crystal. The magnetic moment shows a linear dependence on the Fe film thickness with a reduction (compared to the Fe bulk value) of the magnetic moment equivalent to 0.1 nm bulk Fe for the V-covered films and a reduction equivalent to 0.03 nm bulk Fe for the uncovered Fe films. For the case of the V/Fe/V samples we observe a much smaller reduction of the magnetic moment than reported for experiments on Fe/V multilayers. As theoretical calculations show a strong decrease of the magnetic moment for an interface alloy we conclude that the larger reduction of the magnetization in Fe/V multilayers is due to an increase in interface roughness with increasing film thickness. For the uncovered Fe(100) films we find a much smaller reduction of the magnetic moment than in earlier in situ PNR experiments on V (110) /Fe (110) where we observed a reduction equivalent to 0.4 nm bulk Fe. |
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| Publication date | 2004-12-06 |
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| Publisher | American Physical Society |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 12329220 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | c8ea0666-9d2b-48f3-870b-76e29ea8f67f |
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| Record created | 2009-09-10 |
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| Record modified | 2023-06-23 |
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