Three dimensional accurate morphology measurements of polystyrene standard particles on silicon substrate by electron tomography

From National Research Council Canada

DOIResolve DOI:
AuthorSearch for: 1; Search for: ; Search for: 1
Name affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
Subjectelectron tomography; (scanning) transmission electron microscopy ((S)TEM); polystyrene latex spheres; calibration sample; metrology; accurate shape measurement; surface energy; nanoparticle deformation; quantitative electron tomography
Publication date
Peer reviewedYes
NPARC number23001698
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifiercc54dc45-2a52-4463-b4ca-abe279bd86de
Record created2017-03-20
Record modified2020-04-22
Date modified: