| Download | - View accepted manuscript: Time-resolved imaging of negative differential resistance on the atomic scale (PDF, 888 KiB)
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| Author | Search for: Rashidi, Mohammad1; Search for: Taucer, Marco1; Search for: Ozfidan, Isil1; Search for: Lloyd, Erika1; Search for: Labidi, Hatem1; Search for: Pitters, Jason L.1; Search for: Maciejko, Joseph; Search for: Wolkow, Robert A.1 |
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| Name affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Abstract | Negative differential resistance remains an attractive but elusive functionality, so far only finding niche applications. Atom scale entities have shown promising properties, but viability of device fabrication requires fuller understanding of electron dynamics than has been possible to date. Using an all-electronic time-resolved scanning tunneling microscopy technique and a Green's function transport model, we study an isolated dangling bond on a hydrogen terminated silicon surface. A robust negative differential resistance feature is identified as a many body phenomenon related to occupation dependent electron capture by a single atomic level. We measure all the time constants involved in this process and present atomically resolved, nanosecond timescale images to simultaneously capture the spatial and temporal variation of the observed feature. |
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| Publication date | 2016-08-23 |
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| Publisher | Cornell University Library |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23000902 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | cca0cb31-8e84-4922-82fe-1f338152caa8 |
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| Record created | 2016-11-09 |
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| Record modified | 2020-06-04 |
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