Electron energy loss spectroscopy of interfacial layer formation in Gd2O3 films deposited directly on Si(001)

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.1446232
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for National Measurement Standards
FormatText, Article
Publication date
In
LanguageEnglish
Peer reviewedYes
NPARC number12743764
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Record identifiercde929d3-af7e-4173-b088-8129d3347b09
Record created2009-10-27
Record modified2023-04-17
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