Silicon nanowire based radio-frequency spectrum analyser

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1109/ECOC.2010.5621130
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Name affiliation
  1. National Research Council Canada. NRC Industrial Materials Institute
FormatText
TypeArticle
Proceedings title36th European Conference and Exhibition on Optical Communication
Conference2010 36th European Conference and Exhibition on Optical Communication, ECOC 2010, September 19-23, 2010, Torino, Italy
ISBN978-1-4244-8536-9
Pages13
Abstract
Publication date
PublisherIEEE
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LanguageEnglish
Peer reviewedYes
NPARC number23002572
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Record created2017-11-30
Record modified2017-11-30
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