| DOI | Resolve DOI: https://doi.org/10.1364/OE.21.024185 |
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| Author | Search for: Yu, Xiaming; Search for: Bian, Qiumei; Search for: Chang, Zenghu; Search for: Corkum, P. B.1; Search for: Lei, Shuting |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Subject | Combined pulse; Damage features; Damage threshold; Multiphoton ionization; Nanomachining; Near-infrared; Rate-equation models; Shorter wavelength; Fused silica; Photoionization; Ultrafast lasers; Ultrashort pulses |
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| Abstract | We report on the experimental results of 300 nm features generated on fused silica using a near-infrared (IR) femtosecond laser pulse initiated by an ultraviolet (UV) pulse. With both pulses at a short (~60 fs) delay, the damage threshold of the UV pulse is only 10% of its normal value. Considerable reduction of UV damage threshold is observed when two pulses are at ± 1.3 ps delay. The damage feature size of the combined pulses is similar to that of a single UV pulse. A modified rate equation model with the consideration of defect states is used to help explain these results. This concept can be applied to shorter wavelengths, e.g. XUV and X-ray, with the required fluence below their normal threshold. |
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| Publication date | 2013 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21270345 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | d7d1ea1c-bbeb-4e1c-90ef-e5928c4d224c |
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| Record created | 2014-01-31 |
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| Record modified | 2020-04-22 |
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