| DOI | Resolve DOI: https://doi.org/10.1017/S1431927612004692 |
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| Author | Search for: Li, Peng1; Search for: Kupsta, Martin1; Search for: Cui, Kai1; Search for: Malac, Marek1; Search for: Hosseinkhannazer, Hooman; Search for: Ning, Yuebin; Search for: LaForge, Joshua; Search for: Beaudry, Allan; Search for: Brett, Michael |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2012, July 29 - August 2, 2012, Phoenix, Arizona, United States |
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| Abstract | Electron tomography (ET) can be used to obtain three-dimensional (3D) information about nanoscale objects. Alignment of the images in the ET tilt series and ability to acquire data over sufficient tilt range are often the most critical in ET [1,2]. Here we report on a simple method for producing alignment fiducial markers on a newly developed SiN membrane for electron tomographic experiments. An indium tin oxide (ITO) nanowhisker was used to test the proposed method. |
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| Publication date | 2012-11-23 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | d987d2f6-e8ed-4d10-8ce9-913a0e529651 |
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| Record created | 2020-03-10 |
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| Record modified | 2024-05-15 |
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