Toward quantitative bright field TEM imaging of ultra thin samples

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927618008541
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Affiliation
  1. National Research Council of Canada. Nanotechnology
FormatText, Article
ConferenceMicroscopy & Microanalysis 2018, August 5-9, 2018, Baltimore, Maryland, United States
Abstract
Publication date
PublisherCambridge University Press
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LanguageEnglish
Peer reviewedYes
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Record created2020-01-21
Record modified2024-05-15
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