DOI | Resolve DOI: https://doi.org/10.1017/S1431927618008541 |
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Author | Search for: Fujii, Takashi; Search for: Malac, Marek1; Search for: Kano, Emi1; Search for: Hayashida, Misa1; Search for: Yaguchi, Toshie; Search for: Egerton, Ray |
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Affiliation | - National Research Council of Canada. Nanotechnology
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Format | Text, Article |
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Conference | Microscopy & Microanalysis 2018, August 5-9, 2018, Baltimore, Maryland, United States |
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Abstract | Two dimensional (2D) materials, such as graphene and transition metal dichalcogenides, are of potential interest from both exploratory research and application perspectives. Here we discuss the potential of bright field transmission electron microscopy (BFTEM) for quantitative mass thickness mapping of ultra thin samples illustrated using graphene [1, 2]. |
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Publication date | 2018-08-01 |
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Publisher | Cambridge University Press |
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In | |
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Language | English |
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Peer reviewed | Yes |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | dc6f5dec-8a2d-4c1c-a1b3-b73ede3cfd96 |
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Record created | 2020-01-21 |
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Record modified | 2024-05-15 |
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