Subwavelength index engineered surface grating coupler with sub-decibel efficiency for 220-nm silicon-on-insulator waveguides

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1364/OE.23.022628
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Name affiliation
  1. National Research Council Canada. Information and Communication Technologies
FormatText
TypeArticle
Journal titleOptics Express
ISSN1094-4087
Volume23
Issue17
Pages22628–22635; # of pages: 8
SubjectEfficiency; Optical fibers; Photonic devices; Photonic integration technology; Refractive index; Engineered surfaces; Fiber chip coupling; Fundamental component; Photonic integrated circuits; Silicon on insulator waveguide; Silicon-on- insulators (SOI); Single etch process; Surface grating couplers; Silicon on insulator technology
Abstract
Surface grating couplers are fundamental components in chip-based photonic devices to couple light between photonic integrated circuits and optical fibers. In this work, we report on a grating coupler with sub-decibel experimental coupling efficiency using a single etch process in a standard 220-nm silicon-on-insulator (SOI) platform. We specifically demonstrate a subwavelength metamaterial refractive index engineered nanostructure with backside metal reflector, with the measured peak fiber-chip coupling efficiency of -0.69 dB (85.3%) and 3 dB bandwidth of 60 nm. This is the highest coupling efficiency hitherto experimentally achieved for a surface grating coupler implemented in 220-nm SOI platform.
Publication date
PublisherThe Optical Society
LanguageEnglish
Peer reviewedYes
NPARC number21277379
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