| DOI | Resolve DOI: https://doi.org/10.1017/S1431927610055777 |
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| Author | Search for: Malac, Marek1; Search for: Mcleod, Robert A.1; Search for: Li, Peng1; Search for: Bigelow, Wilbur C.; Search for: Howe, Jane; Search for: Allard, Larry; Search for: Taniguchi, Yoshifumi; Search for: Moreno, M. Sergio |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2010, August 1-5, 2010, Portland, Oregon |
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| Abstract | The detection of electrons in a TEM is typically performed by means of a slow scan CCD camera (SSCCD), film, or image plates. In many advanced applications the ability to reliably and quickly shutter the beam incident onto a detector determines whether usable data can be obtained or not. Various approaches were explored over the years to shutter the beam either above or below the sample. Here we report on the performance of a mechanical shutter in an HF 3300 at NINT. This type shutter was originally designed by one of the authors (WB) for the Hitachi HF2000 cold field emission microscope in 1997. The simple and reliable design is a drop-in replacement for the factory installed shutter, either above or below sample, or for both |
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| Publication date | 2010-08-01 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | e807390b-47cf-4f16-9aa2-4a27e342a226 |
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| Record created | 2020-03-12 |
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| Record modified | 2020-05-21 |
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