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Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/S0304-3991(01)00155-3
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FormatText, Article
Abstract
We discuss improved procedures for fitting a power-law background to an ionization edge in an electron energy-loss spectrum. They place constraints on the background, both above and below the ionization-threshold energy, and are of particular advantage in the case of weak edges arising from low elemental concentrations. The algorithms are currently implemented as short Calculator programs for Gatan EL/P software. Their advantages and limitations are discussed, in comparison with multiple-least-squares and spatial-difference techniques.
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  • Ultramicroscopy 92, no. 2 (1 July 2002): 47–56.
LanguageEnglish
Peer reviewedYes
NRC publication
This is a non-NRC publication

"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC.

NPARC number12329163
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Record created2009-09-10
Record modified2020-03-27
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