Two-Dimensional Profiling of Carriers in a Buried Heterostructure Multi-Quantum-Well Laser: Calibrated Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy

DOI	Resolve DOI: https://doi.org/10.1116/1.1511211
Author	Search for: Ban, D.; Search for: Sargent, E. H.; Search for: Dixon-Warren, St. J.; Search for: Grevatt, T.; Search for: Knight, G.; Search for: Pakulski, Grzegorz¹; Search for: Springthorpe, Anthony¹; Search for: Streater, R.; Search for: White, J. K.
Affiliation	National Research Council of Canada. NRC Institute for Microstructural Sciences
Format	Text, Article
Publication date	2002
In	Journal of Vacuum Science & Technology B 20, no. 5 (2002): 2126–2132.
NPARC number	12744803
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Record identifier	e95e92d8-5414-4ad9-b986-93c894e2bcca
Record created	2009-10-27
Record modified	2020-03-30