Single atom gas field ion sources for scanning ion microscopy
Single atom gas field ion sources for scanning ion microscopy
DOI | Resolve DOI: https://doi.org/10.1007/978-3-319-41990-9_2 |
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Author | Search for: Urban, Radovan1; Search for: Wolkow, Robert A.1; Search for: Pitters, Jason L.1 |
Name affiliation |
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Format | Text, Book chapter |
Book title | Helium Ion Microscopy |
Series title | NanoScience and Technology |
ISSN | 1434-4904 2197-7127 |
ISBN | 978-3-319-41988-6 978-3-319-41990-9 |
Pages | 31–61 |
Abstract | |
Publication date | 2016 |
Language | English |
Peer reviewed | Yes |
NPARC number | 23000868 |
Export citation | Export as RIS |
Report a correction | Report a correction |
Record identifier | f38d8ea3-4d6d-42e3-9abc-8bc2e614daae |
Record created | 2016-10-26 |
Record modified | 2020-06-18 |