| DOI | Resolve DOI: https://doi.org/10.1016/j.elspec.2012.07.003 |
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| Author | Search for: Burke, Kerry B.; Search for: Luber, Erik J.1; Search for: Holmes, Natalie P.; Search for: Murray, Andrew J.; Search for: Belcher, Warwick J.; Search for: Zhou, Xiaojing; Search for: Mitlin, David1; Search for: Dastoor, Paul C. |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Subject | Scanning transmission X-ray microscopy (STXM) resolution; Focussed ion beam (FIB) milling; Metallic glass |
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| Abstract | We present a simple knife-edge measurement of the STXM 5.3.2.2 synchrotron X-ray beam width. The knife edge was constructed by ion beam milling a metallic glass alloy consisting of 60% gold, 20% nickel and 20% hafnium and was determined to be well-defined to within 2 nm by TEM. An asymmetric beam profile of 120 nm FWHM in the vertical direction and 150 nm FWHM in the horizontal direction was determined and was observed to depart from the expected Airy function profile. |
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| Publication date | 2012-11 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Identifier | S0368204812000758 |
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| NPARC number | 21268740 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | f59d1f31-fadc-4bed-8681-af01de2c901e |
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| Record created | 2013-11-12 |
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| Record modified | 2020-04-21 |
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