| DOI | Resolve DOI: https://doi.org/10.1017/S1431927612005132 |
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| Author | Search for: Kupsta, Martin1; Search for: Li, Peng1; Search for: Elliott, Glen; Search for: Mikula, Randy; Search for: Malac, Marek1 |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2012, July 29 - August 2, 2012, Phoenix, Arizona, United States |
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| Abstract | FIB sample preparation for transmission electron microscopy (TEM) analysis is used to observe a site specific area of a sample. Here we report on cryo-TEM sample preparation from bulk bitumen based sample using a cryo-Focused Ion Beam (FIB) and a cryo transfer system. Samples are required to be dry in nature and relatively stable in high vacuum (HV) environments. For TEM observation, samples are required to have small thickness which are on the order of 100 nm to ensure electron transparency [1]. Viscous materials such as oils, petrochemical products, and some organic/inorganic mixtures are difficult or not possible to prepare for TEM observation without the use of solvents or suspensions that do not modify the original state. Preparing TEM compatible and site specific samples from viscous and volatile materials, without solvents, will require the sample to be maintained at cryogenic temperatures and water as vitreous ice can form on the sample during transfer[2]. |
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| Publication date | 2012-11-23 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | f5baa648-830d-4ff1-81a0-559107b367f5 |
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| Record created | 2020-03-10 |
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| Record modified | 2024-05-15 |
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