The surface topography of cracks in strained In0.72Ga0.28P films
The surface topography of cracks in strained In0.72Ga0.28P films
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| DOI | Resolve DOI: https://doi.org/10.1080/09500830050110468 |
| Author | Search for: ; Search for: |
| Format | Text, Article |
| Publication date | 2000 |
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| NPARC number | 12744241 |
| Export citation | Export as RIS |
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| Record identifier | f8cfdd04-53da-41ae-ace2-4aa63a2f0883 |
| Record created | 2009-10-27 |
| Record modified | 2020-03-26 |
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