| DOI | Resolve DOI: https://doi.org/10.1103/PhysRevB.53.16524 |
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| Author | Search for: Marquezini, M.; Search for: Brasil, M.; Search for: Brum, J.; Search for: Poole, Philip1; Search for: Charbonneau, Sylvain1; Search for: Tamargo, M. |
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| Affiliation | - National Research Council Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Abstract | We present a study on the exciton dynamics in a thin quantum well grown with self-assembled islands with thicknesses ranging from 1 to 5 ML. The exciton dynamics is investigated by combinining continuous-wave and time-resolved photoluminescence measurements as a function of temperature. We analyze the exciton dynamics through a system of rate equations and we are able to obtain quantitative information on the exciton localization at the interface roughness. � 1996 The American Physical Society. |
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| Publication date | 1996-06-15 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 12327291 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | f9a44cde-e1ae-4f46-a4db-1372b4ce5063 |
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| Record created | 2009-09-10 |
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| Record modified | 2020-03-20 |
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