Ultrahigh Vacuum Scanning Electron/Tunnelling Combined Microscope System
Ultrahigh Vacuum Scanning Electron/Tunnelling Combined Microscope System
Author | Search for: ; Search for: 1; Search for: |
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Editor | Search for: Shimizu, R.; Search for: Williams, D. |
Affiliation |
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Format | Text, Article |
Conference | Microbeam Analysis 2000, 2000, Bristol |
Publisher | Institute of Physics Publishing |
NPARC number | 12346439 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | fb208f6c-2f8b-4215-b1d2-012d3f50fa2d |
Record created | 2009-09-17 |
Record modified | 2020-04-16 |
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