High precision control of galvanometer scanner
High precision control of galvanometer scanner
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DOI | Resolve DOI: https://doi.org/10.1117/12.967406 |
Author | Search for: Blais, François1 |
Name affiliation |
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Format | Text, Article |
Proceedings title | Optomechanical Systems Engineering |
Series title | Proceedings of SPIE; no. 817 |
Conference | 31st Symposium on Optical Optoelectronic Science Engineering, August 16-21, 1987, San Diego, California, USA |
ISSN | 0277-786X 1996-756X |
Abstract | |
Publication date | 1987 |
Publisher | SPIE |
Note | Mr. Blais was affiliated with the National Research Council of Canada, Division of Electronical Engineering when he authored this article. |
Language | English |
Peer reviewed | Yes |
NRC number | NRCC 28048 |
NPARC number | 5763989 |
Export citation | Export as RIS |
Report a correction | Report a correction | Record identifier | fe121c89-9b75-43dc-bd43-a7d15d296e36 |
Record created | 2009-03-29 |
Record modified | 2020-03-17 |