| DOI | Trouver le DOI : https://doi.org/10.1088/0960-1317/24/6/065021 |
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| Auteur | Rechercher : Westwood, J. N.; Rechercher : Sauer, V. T. K.1; Rechercher : Kwan, J. K.; Rechercher : Hiebert, W. K.1; Rechercher : Sit, J. C. |
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| Affiliation | - Conseil national de recherches du Canada. Technologies de sécurité et de rupture
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| Format | Texte, Article |
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| Sujet | glancing angle deposition; nanoelectromechanical systems; thin films; nanofabrication |
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| Résumé | Nanoelectromechanical systems (NEMS) coated with a high surface area thin film are fabricated. Glancing angle deposition (GLAD) is used to uniformly deposit high surface area, nanostructured SiO2 films on top of released NEMS. The resonance frequencies and quality factors are measured to assess the potential of the high surface area NEMS for sensing experiments. Resonance frequencies of coated cantilevers, although reduced by mass loading, can be predicted accurately using our derived model. Compressive stress makes the resonance frequencies of coated doubly-clamped beams difficult to predict. The quality factors of the coated NEMS are reduced by one order of magnitude by a quasi-continuous layer at the base of the GLAD film, which also introduces an estimated compressive stress of 5.3-9.3 MPa. The limit of detection is demonstrated to be ∼2 pg cm-2. With this successful proof-of-concept demonstration, we anticipate the future use of these devices as high surface area gravimetric mass sensors for applications such as gas chromatography. |
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| Date de publication | 2014-05-19 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 21273005 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 0de506a4-785e-44fe-82a8-a869c24bfbbc |
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| Enregistrement créé | 2014-12-05 |
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| Enregistrement modifié | 2020-04-22 |
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