| Téléchargement | - Voir la version finale : Characterization of integrated photonic devices with minimum phase technique (PDF, 901 Kio)
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| DOI | Trouver le DOI : https://doi.org/10.1364/OE.17.008349 |
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| Auteur | Rechercher : Halir, R.; Rechercher : Molina-Fernández, Í.; Rechercher : Wangüemert-Pérez, J. G.; Rechercher : Ortega-Moñux, A.; Rechercher : De-Oliva-Rubio, J.; Rechercher : Cheben, P.1Identifiant ORCID : https://orcid.org/0000-0003-4232-9130 |
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| Affiliation | - Conseil national de recherches Canada. Institut des sciences des microstructures du CNRC
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| Format | Texte, Article |
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| Résumé | Spurious reflections can preclude the accurate experimental characterization of integrated optical devices. This is particularly important for facet reflections in high refractive index platforms such as Indium Phosphide (InP) or Silicon-on-Insulator (SOI) when no anti-reflective (AR) coating is used. In this paper we present a novel method to recover the original device characteristics from the measured power transmission in the presence of such reflections. Our approach uses minimum phase techniques to reconstruct time domain information which is filtered to remove the reflection artifacts. A criterion to assess if a certain device exhibits the minimum phase characteristics required to apply the technique is given. Simulated and experimental results for multi-mode interference couplers (MMICs) in SOI without AR coating validate the technique. |
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| Date de publication | 2009 |
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| Maison d’édition | Optical Society of America |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 23004577 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 15fb691e-7ccd-42b3-aa7a-45a7690c966e |
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| Enregistrement créé | 2018-11-22 |
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| Enregistrement modifié | 2020-05-30 |
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