| DOI | Trouver le DOI : https://doi.org/10.1007/978-3-642-12297-2_42 |
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| Auteur | Rechercher : Fan, Shufei; Rechercher : Brooks, Rupert1; Rechercher : Ferrie, Frank P. |
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| Affiliation | - Conseil national de recherches du Canada. Institut des matériaux industriels du CNRC
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| Format | Texte, Article |
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| Conférence | 9th Asian Conference on Computer Vision, September 23-27, 2009, Xi’an |
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| Résumé | Accurate image correspondence is crucial for estimating multiple-view geometry. In this paper, we present a registration-based method for improving accuracy of the image correspondences. We apply the method to fundamental matrix estimation under practical situations where there are both erroneous matches (outliers) and small feature location errors. Our registration-based method can correct feature locational error to less than 0.1 pixel, remedying localization inaccuracy due to feature detectors. Moreover, we carefully examine feature similarity based on their post-alignment appearance, providing a more reasonable prior for subsequent outlier detection. Experiments show that we can improve feature localization accuracy of the MSER feature detector, which recovers the most accurate feature localization as reported in a recent study by Haja and others. As a result of applying our method, we recover the fundamental matrix with better accuracy and more efficiency. |
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| Date de publication | 2010 |
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| Maison d’édition | Springer |
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| Dans | |
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| Série | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 23002569 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 1eedffeb-e919-4ccb-b374-fc4cb2f5ec2a |
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| Enregistrement créé | 2017-11-30 |
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| Enregistrement modifié | 2020-04-17 |
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