DOI | Trouver le DOI : https://doi.org/10.1063/1.5123700 |
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Auteur | Rechercher : Mushtaq, Zarlish; Rechercher : Waqas, Abi; Rechercher : Melati, Daniele1; Rechercher : Chowdhry, B. S.; Rechercher : Uqaili, Muhammad Aslam; Rechercher : Melloni, Andrea |
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Affiliation | - Conseil national de recherches du Canada. Électronique et photonique avancées
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Format | Texte, Article |
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Conférence | International Conference on Key Enabling Technologies (KEYTECH 2019), April 24-26, 2019, Istanbul, Turkey |
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Sujet | public policy and governance; materials properties; optical properties; telecommunications; photonic integrated circuits |
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Résumé | The knowledge of material parameters such refractive and its temperature dependence is the foundation for recognition of photonic integrated circuit. In this paper, we present a method to foresee the wavelength reliant on coefficient of thermo optic of GaAs, InP and InGaAsP materials. The projected technique includes composition, temperature and wavelength dependencies in the estimation of refractive index and the coefficient of thermo optic in the wavelength range of telecommunication. The mathematical results attained using the projected method are contrasted with experimented data present in the literature and found in very good agreement. These results can be used for practical modelling of photonic integrated circuits. |
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Date de publication | 2019-08-19 |
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Maison d’édition | AIP Publishing |
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Dans | |
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Série | |
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Langue | anglais |
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Publications évaluées par des pairs | Oui |
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Exporter la notice | Exporter en format RIS |
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Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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Identificateur de l’enregistrement | 26f1a7fb-6e1c-44e0-9a2d-f96e08be8c5a |
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Enregistrement créé | 2021-04-19 |
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Enregistrement modifié | 2021-04-22 |
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