| DOI | Trouver le DOI : https://doi.org/10.1016/0038-1098(94)00777-2 |
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| Auteur | Rechercher : Siegele, R.; Rechercher : Haugen, H. K.; Rechercher : Lockwood, D. J.1; Rechercher : Bryskiewicz, B.1; Rechercher : Forster, J. S.; Rechercher : Andrews, H. R. |
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| Affiliation | - Conseil national de recherches du Canada. Institut des sciences des microstructures du CNRC
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| Format | Texte, Article |
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| Sujet | A. nanostructures; A. semiconductors; D. optical properties; E. ion impact |
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| Résumé | Samples of porous Si (PS) were prepared from p-type 10-35 [Omega]-cm Si under anodisation in aqueous HF (20%) for 10 min. The composition of the PS was measured by heavy-ion elastic recoil detection analysis (HIERDA). In all samples a considerable carbon content varying from 2-20% was measured, while the oxygen and hydrogen concentrations ranged from 2-25% and 10-25%, respectively. The sample wax removing procedure was identified as a source for the high carbon content. The concentration of carbon and its influence on the photoluminescence due to different treatments of PS was investigated. |
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| Date de publication | 1995-03 |
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| Dans | |
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| Langue | anglais |
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| Numéro NPARC | 12333664 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 43b5122a-8cbe-48b6-b74a-dc86494266d8 |
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| Enregistrement créé | 2009-09-10 |
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| Enregistrement modifié | 2020-04-29 |
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