| DOI | Trouver le DOI : https://doi.org/10.1016/j.micron.2017.03.015 |
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| Auteur | Rechercher : Malac, Marek1; Rechercher : Hettler, Simon; Rechercher : Hayashida, Misa1; Rechercher : Kawasaki, Masahiro; Rechercher : Konyuba, Yuji; Rechercher : Okura, Yoshi; Rechercher : Iijima, Hirofumi; Rechercher : Ishikawa, Isamu; Rechercher : Beleggia, Marco |
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| Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
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| Format | Texte, Article |
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| Sujet | hole-free phase plate; volta phase plate; radiation damage; electron beam induced charging; thon rings; fresnel images |
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| Résumé | Detailed simulations are necessary to correctly interpret the charge polarity of electron beam irradiated thin film patch. Relying on systematic simulations we provide guidelines and movies to interpret experimentally the polarity of the charged area, to be understood as the sign of the electrostatic potential developed under the beam with reference to a ground electrode. We discuss the two methods most frequently used to assess charge polarity: Fresnel imaging of the irradiated area and Thon rings analysis. We also briefly discuss parameter optimization for hole free phase plate (HFPP) imaging. Our results are particularly relevant to understanding contrast of hole-free phase plate imaging and Berriman effect. |
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| Date de publication | 2017-04-03 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 23002388 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 495b88f1-4caf-48fe-84be-813576183067 |
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| Enregistrement créé | 2017-10-26 |
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| Enregistrement modifié | 2020-03-16 |
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