| Téléchargement | - Voir la version finale : The effect of interfacial roughness on residual stresses in electron beam-physical vapor deposition of thermal barrier coatings (PDF, 13.7 Mio)
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| DOI | Trouver le DOI : https://doi.org/10.3390/coatings11030341 |
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| Auteur | Rechercher : Zhang, Bochun; Rechercher : Chen, Kuiying1; Rechercher : Baddour, NatalieIdentifiant ORCID : https://orcid.org/0000-0002-7025-7501 |
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| Affiliation | - Conseil national de recherches du Canada. Aérospatiale
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| Format | Texte, Article |
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| Description physique | 39 p. |
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| Sujet | stress model; FE model; evolution of interfacial roughness; parametric study; transitional roughness approximated model |
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| Résumé | Residual stresses play an essential role in determining the failure mechanisms and life of an electron beam-physical vapour deposition thermal barrier coating (EB-PVD TBC) system. In this paper, a new transitional roughness model was proposed and applied to describe the interfacial roughness profile during thermal cycles. Finite element models were implemented to calculate residual stresses at specific positions close to the interface of TBCs using temperature process-dependent model parameters. Combining stresses evaluated at valleys of the topcoat (TC) and excessive sharp tip roughness profiles, positions where the maximum out-of-plane residual stresses occur were identified and used to explain possible cracking routes of EB-PVD TBCs as interfacial roughness evolves during thermal cycling. |
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| Date de publication | 2021-03-17 |
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| Maison d’édition | MDPI |
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| Licence | |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 59b3e6b0-81c3-47a1-9731-9bcc076b5a38 |
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| Enregistrement créé | 2022-11-04 |
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| Enregistrement modifié | 2022-11-04 |
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