| Téléchargement | - Voir la version finale : Transmission electron microscopy imaging and spectroscopy of nanomaterials (PDF, 164 Kio)
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| Auteur | Rechercher : Malac, Marek1 |
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| Affiliation | - Conseil national de recherches du Canada. Technologies de sécurité et de rupture
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| Format | Texte, Allocution |
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| Conférence | Institute of Physics, Czech Academy of Sciences, June 27th, 2016, Prague, Czech Republic |
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| Description physique | 1 p. |
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| Résumé | Transmission electron microscope (TEM) has been used for materials characterizations for decades. With the interest in nanoscience and nanotechnology the possibility to reveal morphology, structure and physical properties at nearly atomic resolution led to vigorous development of TEM methods. Here we will discuss two methods in particular: the momentum resolved electron energy loss spectroscopy (qEELS) and hole free phase plate imaging in TEM. Both methods can be combined with all analytical capabilities of a modern TEM providing insights into material structure relation to its properties. |
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| Date de publication | 2016-06-27 |
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| Maison d’édition | Institute of Physics, Czech Academy of Sciences |
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| Langue | anglais |
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| Publications évaluées par des pairs | Non |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 729c303e-a65f-47cf-afa8-00b55279adb1 |
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| Enregistrement créé | 2020-05-29 |
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| Enregistrement modifié | 2020-05-29 |
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