| DOI | Trouver le DOI : https://doi.org/10.1103/PhysRevLett.112.246802 |
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| Auteur | Rechercher : Martins, B.V.C.1; Rechercher : Smeu, M.; Rechercher : Livadaru, L.; Rechercher : Guo, H.; Rechercher : Wolkow, R.A.1 |
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| Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
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| Format | Texte, Article |
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| Sujet | Quantum electronics; Conducting surfaces; First-principles quantum transports; Intrinsic conductivity; Minimal interactions; Orders of magnitude; Per unit length; Surface conductivity; Transport method; Silicon |
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| Résumé | While it is known that the Si-(7×7) is a conducting surface, measured conductivity values differ by 7 orders of magnitude. Here we report a combined STM and transport method capable of surface conductivity measurement of step-free or single-step containing surface regions and having minimal interaction with the sample, and by which we quantitatively determine the intrinsic conductivity of the Si-(7×7) surface. We found that a single step has a conductivity per unit length about 50 times smaller than the flat surface. Our first principles quantum transport calculations confirm and lend insight into the experimental observation. © 2014 American Physical Society. |
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| Date de publication | 2014 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 21272177 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | a3f76804-3dbc-409f-8f76-1273efacdbb0 |
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| Enregistrement créé | 2014-07-23 |
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| Enregistrement modifié | 2020-04-22 |
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