| DOI | Trouver le DOI : https://doi.org/10.1016/j.sab.2011.12.001 |
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| Auteur | Rechercher : Gusarova, T.; Rechercher : Methven, B.1; Rechercher : Kipphardt, H.; Rechercher : Sturgeon, R.2; Rechercher : Matschat, R.; Rechercher : Panne, U. |
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| Affiliation | - Conseil national de recherches du Canada. Science des mesures et étalons
- Conseil national de recherches du Canada. Institut des étalons nationaux de mesure du CNRC
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| Format | Texte, Article |
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| Sujet | Analytes; Certified reference materials; Circular cross-sections; Copper and zinc; Double-focusing mass spectrometer; Glow Discharge Mass Spectrometry; Mass fraction; Optimal results; Pin sample; Relative sensitivity factor; Copper; Glow discharges; Mass spectrometers; Mass spectrometry; Metric system; Trace analysis; Trace elements; Zinc; Calibration |
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| Résumé | Calibration of two commercially available glow discharge double focusing mass spectrometers, the VG 9000 and Element GD, is described using synthetic pin standards pressed from solution doped copper and zinc matrices. A special pressing die was developed for this purpose and optimal results were obtained with the highest possible pressures, i.e., 95 kN•cm - 2. This calibration approach permits the determination of trace element mass fractions down to μg•kg -1 with small uncertainties and additionally provides traceability of the GD-MS results in the most direct manner to the SI (International System of Units). Results were validated by concurrent measurements of a number of compact copper and zinc certified reference materials. The impact of the sample pin cross-section (circular or square) was investigated with the use of a new pin-sample holder system for the Element GD. The pin-sample holder was designed by the manufacturer for pin-samples having circular cross-section; however, samples with square pin cross-section were also shown to provide acceptable results. Relative Sensitivity Factors for some 50 analytes in copper (VG 9000, Element GD) and zinc matrices (VG 9000) are presented. The field of applicability of GD-MS may be considerably extended via analysis of pin geometry samples based on their ease of preparation, especially with respect to the accuracy and traceability of the results and the enhanced number of analytes which can be reliably calibrated using such samples. © 2011 Elsevier B.V. All rights reserved. |
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| Date de publication | 2011-12-09 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 21271087 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | a9914748-e58d-46be-a1a2-5e0f8c1c1b9e |
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| Enregistrement créé | 2014-03-24 |
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| Enregistrement modifié | 2020-04-21 |
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